Browse Topic: Semiconductor devices
Imaging LiDAR systems such as Goddard’s Reconfigurable Solid-state LiDAR (GRSSLi) must collect and process reflected pulses of light in order to correctly assemble a three-dimensional image of the scene. These pulses of light generally range from 2-5 nanoseconds in duration. Consequently, to collect a large number of samples for this short pulse, a high-sample-rate analog to digital converter (ADC) must be used. Other methods such as threshold detection could be used, but generally these detection methods suffer degradation in overall range, measurement accuracy, and precision due to the random nature of return pulse intensity. In addition, scientifically valuable information can be gleaned from the shape of the returned waveform.
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