Browse Topic: Transistors
This is a modification to technology for realizing durable and stable electrical functionality of high-temperature transistors. This modification is believed crucial to experimental implementation of SiC junction field effect transistors that electrically operated continuously at 500 °C for over 10,000 hours in an air ambient with less than 10% change in operational transistor parameters.
Current RHBD electronics are limited to speeds that approximate 250 MHz, regardless of the electronic process. The fact that determines the final speed is based on the nature of the current SEU (single-event upsets) radiation-tolerant latches, and the data flow between the latches through combinational logic.
A concept was developed for a multi-gigabit-rate, radiation-hardened (RH) bus that would support open-system architecture and provide a cost-effective, high-speed interconnect. This concept is based on Advanced Science and Novel Technology Company’s SerDes system, which supports a variety of interfaces, and operates at frequencies from DC to more than 15 GHz. The design of the improved SerDes is based on the company’s proprietary library of RH cells and functional blocks using annular FETs (field-effect transistors) that are available in commercial CMOS (complementary metal-oxide-semiconductor) technologies. Bus architecture and preliminary SerDes circuit design have been accomplished during this phase. At the time of this reporting, the complete chip was to be designed and fabricated in the next phase.
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