Browse Topic: Transistors

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Silicon Based Mid-Infrared SiGeSn Heterostructure Emitters and Detectors17AERP02_072/1/2017
Enhancing the performance of GeSn p-i-n photodiodes using gold metal nanostructures. Air Force Research Laboratory, Arlington, Virginia The goal of this research project was to advance the science and technology of silicon-based photonic devices using SiGeSn heterostructures. Such devices work in mid-IR spectral range and form the foundation for mid-IR photonics that enable on-chip systems for applications ranging from vibrational spectroscopy, chem/bio sensing, medical/health uses, to environmental monitoring. This project was mostly directed toward improving GeSn detectors with the use of surface plasmons induced by carefully designed metal nanostructures. The goal was to replace the current mid-IR detectors that are usually photodiodes made from narrow bandgap III-V or II-VI semiconductor compounds such as InGaAs, InSb, HgCdTe (MCT) or type-II InGaAs/InGaSb superlattice. These photodiodes are incompatible with the CMOS process and cannot be easily integrated with Si electronics. The GeSn mid-IR detectors developed in this project are fully compatible with the CMOS process. Beginning with GeSn-based p-i-n photodiodes with an active GeSn layer that is almost fully strained, the strategy is to use the surface plasmon effect to enhance the optical field in the GeSn active region, which leads to increased absorption of incident photons and creates electron-hole pairs that contribute to the electric current that can be detected. Specifically, the use of a gold metal film perforated with a two-dimensional subwavelength hole array as the plasmonic structure to be deposited on top of the GeSn p-i-n photodetector was considered. Such structures are capable of producing enhanced optical fields under the illumination of some wavelengths residing in its surface plasmon resonance range. They have been used to improve the performance of quantum dot infrared photodetectors (QDIPs). Increased photocurrent and detection wavelength selection have been demonstrated.
Energy-Filtered Tunnel Transistor: A New Device Concept Toward Extremely Low Energy Consumption Electronics17AERP02_092/1/2017
Altering the thermal characteristics of semiconductors can prolong battery life. Office of Naval Research, Arlington, Virginia Excessive heat dissipation (or power consumption) of modem integrated circuits is an undesirable effect that imposes substantial limitations on the performance of many electronic devices. For example, the level of heat dissipation /power consumption of smart phones, tablets, and laptops is such that it prohibits a continuous and prolonged operation of these devices, requiring frequent recharging. Large power consumption of electronic devices requires large energy storage in batteries, increasing the battery weights that soldiers carry in their missions or the weights of remote controlled equipment such as unmanned aerial vehicles (UAVs). Therefore, technology that enables electronic devices to operate with extremely small energy consumption promises a broad range of commercial, military and space applications. The root cause of heat dissipation of current metal-oxide-semiconductor field effect transistors (MOSFETs) is the thermal excitation of electrons that obeys thermodynamics, i.e., the Fenni-Dirac energy distribution of electrons. The thermally excited electrons at the tail of the Fenni-Dirac distribution can overcome the energy barrier set in the OFF state of the MOSFETs. This causes substantial OFF state leakage currents even after the gate voltage is reduced below the threshold voltage, resulting in large heat dissipation or energy consumption for integrated circuits. The challenge for this large heat dissipation is that its root cause is an intrinsic phenomenon of thermodynamics (Fermi-Dirac distribution) that cannot be directly manipulated.
Transmission-Mounted Power Control Unit with High Power Density for Two-Motor Hybrid System2016-01-12234/5/2016
A second-generation power control unit (PCU) for a two-motor hybrid system is proposed. An optimally designed power module, which is a key component of the PCU, is applied to increase heat-resistant temperature, while the basic structure of the first generation is retained and the power semiconductor chip is directly cooled from the single side. In addition to the optimum design, by decreasing the power loss as well as increasing the heat-resistant temperature of the power semiconductors (IGBT: Insulated Gate Bipolar Transistor and FWD: Free Wheeling Diode), the proposed PCU has attained 25% higher power density and 23% smaller size compared to first-generation units, maintaining PCU efficiency (fuel economy). To achieve a high yield rate in the power module assembly process, a new screening technology is adopted at the initial stage of power module manufacturing. In the proposed technology, the maximum current required by hybrid systems can be applied to the component power semiconductor chips at high temperatures before power module assembly. The proposed PCU is directly mounted on the transmission case in the engine compartment of the vehicle and connected to the motor using three-phase connectors. Since conventional three-phase AC cables are eliminated in the layout, space saving and flexibility in the engine compartment layout are provided, simplifying the process of vehicle assembly.
Kashimura, YukiyaNegoro, Yuki
IGBT Gate Control Methods to Reduce Electrical Power Losses of Hybrid Vehicles2016-01-12244/5/2016
Reducing the loss of the power control unit (PCU) in a hybrid vehicle (HV) is an important part of improving HV fuel efficiency. Furthermore the loss of power devices (insulated gate bipolar transistors (IGBTs) and diodes) used in the PCU must be reduced since this amounts to approximately 20% of the total electrical loss in an HV. One of the issues for reducing loss is the trade-off relationship with reducing voltage surge. To restrict voltage surge, it is necessary to slow down the switching speed of the IGBT. In contrast, the loss reduction requires the high speed switching. One widely known method to improve this trade-off relationship is to increase the gate voltage in two stages. However, accurate and high-speed operation of the IGBT gate control circuit is difficult to accomplish. This research clarifies a better condition of the two-stage control and designed a circuit that improves this trade-off relationship by increasing the speed of feedback control. Combining two-stage control with this new feedback method reduced loss by approximately 4%, helping to improve vehicle fuel efficiency. In addition to reducing loss, this development also improved the trade-off relationship between reducing loss and voltage surge. This is also regarded as a promising gate control method for potential next-generation devices such as reverse conducting IGBTs (RC-IGBTs) and silicon carbide metal-oxide-semiconductor field-effect transistors (SiC MOSFETs).
Osanai, YosukeWasekura, MasakiYamawaki, HideoShindo, Yusuke
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