Browse Topic: Transistors
This is a modification to technology for realizing durable and stable electrical functionality of high-temperature transistors. This modification is believed crucial to experimental implementation of SiC junction field effect transistors that electrically operated continuously at 500 °C for over 10,000 hours in an air ambient with less than 10% change in operational transistor parameters.
Current RHBD electronics are limited to speeds that approximate 250 MHz, regardless of the electronic process. The fact that determines the final speed is based on the nature of the current SEU (single-event upsets) radiation-tolerant latches, and the data flow between the latches through combinational logic.
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