Browse Topic: Printed circuit boards

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We are living in a digitally integrated and connected world. Evidenced by the use of smartphones, smartwatches, and other smart devices, there is no ending this trend. This holds true across many industries and applications, but is especially prevalent within medtech devices — a market that’s predicted to reach $432.6 billion by 2025.1
Preliminary Study of LIDAR Scanner-Based Collision Avoidance in Automated Guided Systems for Autonomous Power Equipment Products2018-01-00324/3/2018
Technology is continuously being developed to prevent self-driving vehicles from crashing. That technology could also be considered for other autonomous products. Collision avoidance in automated guided systems using a light detection and ranging (LIDAR) scanner has been studied for application in low-speed autonomous Honda Power Equipment products, such as self-driving lawn mowers. The automotive application of a LIDAR scanner for autonomous driving is used for obstacle detection and offline local area. Such delineations do not exist in areas where power equipment is used, such as grass fields; therefore, identifying object height and distance is a relatively new area. For this study, a small LIDAR scanner with a resolution of 0.01 m and a measurement range of 0.05 to 40.00 m was used on a Honda self-driving lawn mower. The measurement distance data was directly processed in the scanner, enabling the drive unit to obtain distance information during actual operation. Based on real-time data, collision avoidance and automated operation guidance could be achieved. Simplified object detection and an automated guided decision-making system were developed. System parameters were considered to optimize collision avoidance and the structure of the automated guided system. Field testing was performed at a dedicated test field facility, and the test condition was determined. Fences, tall grass, and ground levels were successfully classified during testing operation. Collision avoidance, running, and stop modes were identified by onboard LIDAR scan data. Based on the field test analysis, a developed autonomous system structure is suitable for lawn, snow, and future power equipment applications.
Hasegawa, ToshiyukiWians, Jeff
The scope of this SAE Information Report is to provide general information relative to the nature and use of infrared techniques for nondestructive testing. The document is not intended to provide detailed technical information, but will serve as an introduction to the theory and capabilities of infrared testing and as a guide to more extensive references.
Metals Technical Committee
Solder Void Modeling and Its Influence on Thermal Characteristics of MOSFETs in Automotive Electronics Module *CSP Meta QA Testing*2017-01-00113/28/2017
Current generation automobiles are controlled by electronic modules for performing various functions. These electronic modules have numerous semiconductor devices mounted on printed circuit boards. Solders are generally used as thermal interface material between surface mount devices and printed circuit boards (PCB) for efficient heat transfer. In the manufacturing stage, voids are formed in solders during reflow process due to outgassing phenomenon. The presence of these voids in solder for power packages with exposed pads impedes heat flow and can increase the device temperature. Therefore it is imperative to understand the effect of solder voids on thermal characteristics of semiconductor devices. But the solder void pattern will vary drastically during mass manufacturing. Replicating the exact solder void pattern and doing detail simulation to predict the device temperature for each manufactured module is not practical. Hence different numerical models are studied for the solder, by using single and distributed void patterns matching the percentage void fraction. The numerical studies indicated that distributed void pattern captures the void behavior well compared to single void model. For the MOSFET (Metal-Oxide-Semiconductor-Field-Effect-Transistor) device under study, it is observed that the void percentage up to 20% has negligible impact on device temperature for its maximum rated power. The temperature rise because of increase in void percentage (from 20% to 50%) for different power ratings of MOSFET is discussed in the paper. A risk rating chart is also provided as guideline for solder void rejection.
Sridharan, Kesav KumarViswanathan, Swaminathan
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