High-Resolution, Coherent, Dual-Tip Scanning Probe Microscope

The scanning tunneling microscope (STM) has become one of the most powerful tools used in studying the surface structure of electrically conducting solid-state materials at an atomic resolution. Since its conception, the STM has had the greatest impact in the field of modern surface science because of its superior capability of characterizing and resolving the surface atomic structures and defects. Surface features such as atomic point defects, dislocations, and grain boundary identification can routinely be studied using a STM. Furthermore, STMs also allow the characterization of step structures at the atomic level during the processes of surface preparation and growth of semiconductors, such as epitaxial growth on semiconductor structures.